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The first generation of AIT probe platform is a wafer level chip test equipment that can realize the fully automatic operation of 6/8/12 inch Wafer, and is high-precision, highly reliable, and can switch products freely
Technical parameters:
Fully automatic testing system, automatic loading and unloading
High precision motion module XYZ axis precision up to ± 2um, R axis resolution 0.0001 °
Meet 12 inch, 8 inch and 6 inch Wafer
Product application:
Wafer test
Suitable for mass production
